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Failure mode and lifetime evaluation of 808nm high power semiconductor laser bars

  • Source: 2022 23rd International Conference on Electronic Packaging Technology (ICEPT) Electronic Packaging Technology (ICEPT), 2022 23rd International Conference on. :1-3 Aug, 2022

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Multistage Degradation Prediction Based on Degradation Pattern Recognition and Long Short-Term Memory

  • Source: 2022 5th International Conference on Artificial Intelligence and Big Data (ICAIBD) Artificial Intelligence and Big Data (ICAIBD), 2022 5th International Conference on. :422-426 May, 2022

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A Semi-Supervised Learning Algorithm for Predicting MiRNA-Disease Association

  • Source: 2021 IEEE International Conference on Bioinformatics and Biomedicine (BIBM) Bioinformatics and Biomedicine (BIBM), 2021 IEEE International Conference on. :771-774 Dec, 2021

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Phase-SLAM: Mobile Structured Light Illumination for Full Body 3D Scanning

  • Source: 2021 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) Intelligent Robots and Systems (IROS), 2021 IEEE/RSJ International Conference on. :1617-1624 Sep, 2021

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Degradation Studies on 8-Layer 3D Vertical Resistive Random Access Memory Under Moisture

  • Source: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2021 IEEE International Symposium on

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  • 1-10 of  3,904 results for ""Gao, Rui""